<?xml version="1.1" encoding="UTF-8"?>
<safety:FailureCollection xmi:version="2.0" xmlns:xmi="http://www.omg.org/XMI" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:safety="http://www.ikv.de/medini/metamodels/SafetyModel/1.0" xmi:id="_YK9FcGlDEfC0mMXW96r_VA" mediniIdentifier="_YK9FcGlDEfC0mMXW96r_VA" name="Failure Modes : Gate Driver">
  <collectionType href="http://www.ikv.de/medini/metamodels/SafetyModel/1.0#//FailureMode"/>
  <failures xsi:type="safety:FailureMode" xmi:id="_e0sZkGlDEfC0mMXW96r_VA" mediniIdentifier="_e0sZkGlDEfC0mMXW96r_VA" id="FM1797" name="Charge Pump Capacitor Fails">
    <measureGroups xsi:type="safety:MeasureGroup" xmi:id="_BrLv8GlHEfC0mMXW96r_VA" mediniIdentifier="_BrLv8GlHEfC0mMXW96r_VA">
      <preventionMeasures href="../commons/_0fdikF4vEfCZKp8u5J2grA.measures#_-o640GlGEfC0mMXW96r_VA"/>
    </measureGroups>
  </failures>
  <failures xsi:type="safety:FailureMode" xmi:id="_g5EFEGlDEfC0mMXW96r_VA" mediniIdentifier="_g5EFEGlDEfC0mMXW96r_VA" id="FM1798" name="Gate Protection Diode Leakage"/>
  <failures xsi:type="safety:FailureMode" xmi:id="_JRFxYGlHEfC0mMXW96r_VA" mediniIdentifier="_JRFxYGlHEfC0mMXW96r_VA" id="FM1801" name="Temperature Drift "/>
  <failures xsi:type="safety:FailureMode" xmi:id="_K_raIGlHEfC0mMXW96r_VA" mediniIdentifier="_K_raIGlHEfC0mMXW96r_VA" id="FM1802" name="Component Degradation "/>
  <failures xsi:type="safety:FailureMode" xmi:id="_6qrFIGlHEfC0mMXW96r_VA" mediniIdentifier="_6qrFIGlHEfC0mMXW96r_VA" id="FM1804" name="Silicone Level Fault"/>
</safety:FailureCollection>
